Call for Papers

    Model-Based Verification & Validation

 From Research to Practice  

July 9th, 2009, Shanghai, China

The 1st Workshop in conjunction with SSIRI 2009 (

(The 3rd IEEE International Conference on Secure Software Integration and Reliability Improvement)


Costs entailed by software failures demonstrate that, even after decades of research, the systematic development of software of a certain quality is still a challenge. A reason for this can certainly be found within the individual projects. Often, known techniques of quality assurance are not well understood or properly used due to deadline and budget restrictions. However, another reason is the lack of techniques for quality assurance for specific types of software and software developed according to specific programming and modeling techniques. Many ad hoc security specifications, models, and protocols, which were implemented in software components in the past, turned out to be vulnerable to some extent. Formal verification and validation methodologies have the potential to increase user confidence in software artifacts. Therefore, theoretical foundations for security assurance should be investigated to discover new methods that will bring high certainty to the trustworthiness of software entities. Verification and validation (V&V) methods, especially testing, deliver important analytical techniques for quality assurance. In model-based V&V, the software under consideration is considered by means of a model that focuses on certain aspects, often on the behavior, of the software. Models frequently used are finite state machines and flow graphs. Testing techniques based on such models includeformal verification, control and data flow analysis, test case generation, and model checking. This workshop will give researchers and practitioners a platform for presenting their results and experience to a broader audience. The topics of interest include, but are not limited to:

  • Formal methods and theories in model-based V&V
  • Simulation by models, forecasts of behavior and properties by models
  • Models and modeling notations for programming and V&V
  • Tools for model-based V&V 
  • Model-based security evaluation     
  • V&V of security specifications, models, and protocols
  • Theoretical foundations of security analysis and design
  • Formal models for security testing
  • Testing with software usage models
  • Test case generation based on formal and semi-formal models
  • Test coverage metrics and criteria for model-based testing
  • Models as test oracles, test validation with models
  • Application of model checking in testing
  • Model-based V&V of reactive and object-oriented systems
  • Model-based verification and validation of tests
  • Experience reports and requirements from model-based V&Vand model-based development in practice
Important dates

April 30:         Submission deadline (extended)

May 14:          Notification date (extended)

May 20:          Camera-ready

Submission, Workshop Proceedings, Paper Presentation

Submit original papers (not published or submitted elsewhere) with a maximum of ten pages. Include the title of the paper, the name and affiliation of each author, a 150-word abstract, and up to 8 keywords. The format of your submission must follow the IEEE conference proceedings format. Please submit your paper at

Accepted submissions will be published by IEEE Press and available in the IEEE digital library. One of the authors needs to register and present the accepted submission. Each paper has 30 minutes, with 20-25 minute presentation.


Fevzi BelliAxel Hollmann (, hollmann[at], University of Paderborn, Germany

Tugkan Tuglular (tugkantuglular[at], Izmir Institute of Technology, 35430 Urla-Izmir, Turkey

Please do not hesitate to contact us by email MVV09[at] if you have any question or remarks.

Program Committee
Colin Atkinson, University of Mannheim, Germany
Tolga Ayav, Izmir Institute of Technology, Turkey
Alexander Bolotov, University of Westminster, United Kingdom
Jean-Michel Bruel, Université de Pau et des Pays de l'Adour, France
Christof J. Budnik, Siemens Corporate Research, Princeton, USA
Klaus Didrich, Siemens AG, Germany
Ali Dogru, Middle East Technical University, Turkey
Dimitris Dranidis, CITY College, Greek
Jens Grabowski, University of Göttingen, Germany
Wolfgang Grieskamp, Microsoft Research, USA
Karl-Erwin Großpietsch, GMD, Birlinghoven, Germany
Volker Gruhn, University of Leipzig, Germany
Walter Gutjahr, University of Vienna, Austria
Uwe Hehn, method park Software AG, Germany
Maritta Heisel, University of Duisburg-Essen, Germany
Oliver Jack, University of Applied Sciences Jena, Germany
Vyacheslav Kharchenko, National Aerospace University, Kharkiv, Ukraine
Ahmet Koltuksuz, Izmir Institute of Technology, Turkey
Fei-Ching Kuo, Swinburne University of Technology, Australia
Bruno Legeard, Smartesting, France
Peter Liggesmeyer, University of Kaiserslautern, Germany
Zoltan Adam Mann, Budapest University of Technology and Economics, Hungary
Dirk Meyerhoff, Schüco Internat. KG, Germany
Ralf Reussner, University of Karlsruhe, Germany
Alexander Romanovsky, University of Newcastle upon Tyne, United Kingdom
Thomas Roßner, imbus AG, Germany
Francesca Saglietti, University of Erlangen, Germany
Ina Schieferdecker, Fraunhofer FOKUS, Germany
Andreas Spillner, Bremen University of Applied Sciences, Germany
Hasan Ural, University of Ottawa, Canada
Marlon Vieira, Siemens Corporate Research, USA
Xinming Wang, Hong Kong University of Science and Technology, China
Joachim Wegener, Berner & Mattner Systemtechnik GmbH, Germany
Mario Winter, Cologne University of Applied Sciences, Germany
Eric Wong, UT Dallas, USA
Hüsnü Yenigün, Sabanci University, Turkey
Hong Zhu, Oxford Brookes University, United Kingdom

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